The main feature of Scanning Acoustic Microscope (SAM) is its ability to non-destructively examine the interior of opaque materials with the resolution of an optical light microscope. The demand for non-destructive imaging and materials analysis has increased significantly in recent times. For instance, quality control Inspection and process optimization are paramount for the semiconductor, microelectronics and MEMS industries where SAM technology is now fast becoming the technique of choice. PVA TePla excels in innovations and developments of advanced solutions applications using Scanning Acoustic Microscopy for both laboratory and production environments.
